In-situ Work Function Measurement of Molecular Beam Epitaxy Film Surface Using RHEED-Beam Excited Secondary Electron Peaks
نویسندگان
چکیده
منابع مشابه
Pure electron-electron dephasing in percolative aluminum ultrathin film grown by molecular beam epitaxy
We have successfully grown ultrathin continuous aluminum film by molecular beam epitaxy. This percolative aluminum film is single crystalline and strain free as characterized by transmission electron microscopy and atomic force microscopy. The weak anti-localization effect is observed in the temperature range of 1.4 to 10 K with this sample, and it reveals that, for the first time, the dephasin...
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ژورنال
عنوان ژورنال: Journal of Surface Analysis
سال: 2002
ISSN: 1341-1756,1347-8400
DOI: 10.1384/jsa.9.344